Robust defect detection with distortion measurement in one package
Our Optical Sheet Inspection system was designed from the ground up for sheet manufacturers. The system consists of both a “standard” defect detection and classification system as well as optical distortion measurement, all in one package using one clear user interface.
A specially designed illumination system allows detection of both dark and clear defects with unparalleled sensitivity. While dark defects are detected using standard bright field illumination, clear defect are detected using dark field illumination.
The Optical Sheet Inspection system’s distortion measurement gives an overall indication of the sheet distortion and detects distortion irregularities and the shallowest optical defects. The system is the first and only one of it’s kind to provide DIN 52305 compatible distortion measurement in an online system.
Cross saw integration
The system optimizes the cross cutting saw and automatically and efficiently removes the smallest possible disqualified sheet sections with minimum scrap, instead of disqualifying full size sheets. Integration with the stacker also allows multiple stacks with different quality levels.
A simple to operate yet sophisticated, field proven user interface answers the different needs of the line operator, line manager, quality assurance department and plant engineering. Watch the video below for more information.
A few of the Optical Sheet Inspection system’s main features
Multiple illumination systems are used for enhanced defect detection: Bright field – for dark defects detection, Dark field – for clear defects and Distortion field
Line operator toolbox
Line operator toolbox
A dedicated, simple line operator display showing the line, manufactured sheets status and indicators of the production quality with alarms, drill down tools and rolling maps of defects and distortion
The system virtually dividessheets in to sub-sheets, calculating total quality level based on the quality level of each sub-sheet and controlling the stacker accordingly.
The entire run history is stored including all information that was available during the run: Defect/distortion maps, defect pictures, quality tests, trends etc.
Reports can be generated for each one of the qualified/scrappedsheets